Electron density profile measurements at a self-focusing ion beam with high current density and low energy extracted through concave electrodes

Journal Article · Sat Feb 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4827680· OSTI ID:22253723

Nakamiya, A.; Sakakita, H. ^[1]; Hirano, Y. ^[2]; Kiyama, S.; Koguchi, H. ^[2]

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1. Department of Engineering Mechanics and Energy, University of Tsukuba, Ibaraki (Japan)
2. Innovative Plasma Technologies Group, National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki (Japan)

The self-focusing phenomenon has been observed in a high current density and low energy ion beam. In order to study the mechanism of this phenomenon, a special designed double probe to measure the electron density and temperature is installed into the chamber where the high current density ion beam is injected. Electron density profile is successfully measured without the influence of the ion beam components. Estimated electron temperature and density are ∼0.9 eV and ∼8 × 10{sup 8} cm{sup −3} at the center of ion beam cross section, respectively. It was found that a large amount of electrons are spontaneously accumulated in the ion beam line in the case of self-forcing state.

• OSTI ID: 22253723
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CROSS SECTIONS
CURRENT DENSITY
ELECTRODES
ELECTRON DENSITY
ELECTRON TEMPERATURE
EV RANGE 01-10
FOCUSING
ION BEAMS
MEASURING INSTRUMENTS
MEASURING METHODS