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Title: Note: Electrical detection and quantification of spin rectification effect enabled by shorted microstrip transmission line technique

We describe a shorted microstrip method for the sensitive quantification of Spin Rectification Effect (SRE). SRE for a Permalloy (Ni{sub 80}Fe{sub 20}) thin film strip sputtered onto SiO{sub 2} substrate is demonstrated. Our method obviates the need for simultaneous lithographic patterning of the sample and transmission line, therefore greatly simplifying the SRE measurement process. Such a shorted microstrip method can allow different contributions to SRE (anisotropic magnetoresistance, Hall effect, and anomalous Hall effect) to be simultaneously determined. Furthermore, SRE signals from unpatterned 50 nm thick Permalloy films of area dimensions 5 mm × 10 mm can even be detected.
Authors:
;  [1] ;  [1] ;  [2] ;  [3]
  1. Center for Superconducting and Magnetic Materials, Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551 (Singapore)
  2. (China)
  3. Temasek Laboratories, National University of Singapore, 5A Engineering Drive 2, Singapore 117411 (Singapore)
Publication Date:
OSTI Identifier:
22253537
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANISOTROPY; HALL EFFECT; MAGNETORESISTANCE; PERMALLOY; SILICA; SILICON OXIDES; SPIN; SPUTTERING; SUBSTRATES; THIN FILMS