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Title: Development of fast heating electron beam annealing setup for ultra high vacuum chamber

We report the design and development of a simple, electrically low powered and fast heating versatile electron beam annealing setup (up to 1000 °C) working with ultra high vacuum (UHV) chamber for annealing thin films and multilayer structures. The important features of the system are constant temperature control in UHV conditions for the temperature range from room temperature to 1000 ºC with sufficient power of 330 W, at constant vacuum during annealing treatment. It takes approximately 6 min to reach 1000 °C from room temperature (∼10{sup −6} mbar) and 45 min to cool down without any extra cooling. The annealing setup consists of a UHV chamber, sample holder, heating arrangement mounted on suitable UHV electrical feed-through and electronic control and feedback systems to control the temperature within ±1 ºC of set value. The outside of the vacuum chamber is cooled by cold air of 20 °C of air conditioning machine used for the laboratory, so that chamber temperature does not go beyond 50 °C when target temperature is maximum. The probability of surface oxidation or surface contamination during annealing is examined by means of x-ray photoelectron spectroscopy of virgin Cu sample annealed at 1000 °C.
Authors:
 [1] ;  [2] ;  [3] ; ;  [4] ;  [5] ;  [1]
  1. UGC-DAE Consortium For Scientific Research, University Campus, Khandwa Road, Indore 452 001, MP (India)
  2. (India)
  3. (Germany)
  4. Institute of Physics, University of Greifswald, Felix Hausdroff Str. 6 (Germany)
  5. School of Electronics, Devi Ahilya University, Indore 452001, MP (India)
Publication Date:
OSTI Identifier:
22253521
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ANNEALING; COOLING; ELECTRON BEAMS; HEATING; OXIDATION; SAMPLE HOLDERS; SURFACE CONTAMINATION; TEMPERATURE CONTROL; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY