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Title: A contactless microwave-based diagnostic tool for high repetition rate laser systems

We report on a novel electro-optic device for the diagnostics of high repetition rate laser systems. It is composed of a microwave receiver and of a second order nonlinear crystal, whose irradiation with a train of short laser pulses produces a time-dependent polarization in the crystal itself as a consequence of optical rectification. This process gives rise to the emission of microwave radiation that is detected by a receiver and is analyzed to infer the repetition rate and intensity of the pulses. We believe that this new method may overcome some of the limitations of photodetection techniques.
Authors:
 [1] ;  [2]
  1. Dip. di Fisica e Astronomia and INFN sez. di Padova, Via F. Marzolo 8, I-35131 Padova (Italy)
  2. CNISM unit, Dip. di Fisica e Astronomia and INFN sez. di Padova, Via F. Marzolo 8, I-35131 Padova (Italy)
Publication Date:
OSTI Identifier:
22253514
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; CRYSTALS; EMISSION; IRRADIATION; LASERS; MICROWAVE RADIATION; POLARIZATION; PULSES; TIME DEPENDENCE