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Title: Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

The determination of the dynamic spring constant (k{sub d}) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the non-destructive, fast, and accurate measurement method of the cantilever dynamic spring constant by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012)] is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (k{sub eff}, the dynamic one k{sub d}), and the calculated (k{sub d,1}) are in good agreement within less than 10% error.
Authors:
; ;  [1]
  1. Nanostructured Materials and Interfaces Group, Zernike Institute for Advanced Materials, Nijenborgh 4, 9747 AG Groningen (Netherlands)
Publication Date:
OSTI Identifier:
22253504
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; CALIBRATION; ENGINEERS; ERRORS; GEOMETRY; SPRINGS