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Title: Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.
Authors:
;  [1] ;  [2]
  1. Birck Nanotechnology Center, 1205 W. State Street, Purdue University, West Lafayette, Indiana 47907 (United States)
  2. Asylum Research, 6310 Hollister Ave., Santa Barbara, California 93117 (United States)
Publication Date:
OSTI Identifier:
22253262
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 26; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; INFRARED SPECTRA; MAPPING; NANOSTRUCTURES; SHAPE; SURFACES