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Title: Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films

A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni{sub 50}Mn{sub 32}Sn{sub 18} thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.
Authors:
 [1] ;  [2] ; ; ;  [3] ; ;  [4] ;  [1] ;  [1] ;  [2]
  1. IFW Dresden, Institute for Complex Materials, P.O. Box 27 01 16, 01171 Dresden (Germany)
  2. (Germany)
  3. Department of Physics, Thin Films and Physics of Nanostructures, Bielefeld University, 33501 Bielefeld (Germany)
  4. Max-Planck Institut für Eisenforschung, 40237 Düsseldorf (Germany)
Publication Date:
OSTI Identifier:
22251752
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 3; Journal Issue: 12; Other Information: (c) 2013 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANTIFERROMAGNETISM; EPITAXY; MARTENSITE; MARTENSITIC STEELS; PHASE TRANSFORMATIONS; THICKNESS; THIN FILMS