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Title: In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

In situ electrochemical X-ray photoelectron spectroscopy (XPS) apparatus, which allows XPS at solid/liquid interfaces under potential control, was constructed utilizing a microcell with an ultra-thin Si membrane, which separates vacuum and a solution. Hard X-rays from a synchrotron source penetrate into the Si membrane surface exposed to the solution. Electrons emitted at the Si/solution interface can pass through the membrane and be analyzed by an analyzer placed in vacuum. Its operation was demonstrated for potential-induced Si oxide growth in water. Effect of potential and time on the thickness of Si and Si oxide layers was quantitatively determined at sub-nanometer resolution.
Authors:
 [1] ;  [2] ; ; ;  [3] ;  [1] ;  [2] ;  [4] ;  [5] ;  [6] ;  [1] ;  [4] ;  [5]
  1. Global Research Center for Environment and Energy Based on Nanomaterials Science (GREEN), National Institute for Materials Science (NIMS), Tsukuba 305-0044 (Japan)
  2. (JST), 4-1-8 Honcho, Kawaguchi, Saitama 333-0012 (Japan)
  3. Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS), Sayo, Hyogo 679-5148 (Japan)
  4. (Japan)
  5. (WPI-MANA), National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044 (Japan)
  6. Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603 (Japan)
Publication Date:
OSTI Identifier:
22224150
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 11; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; AMINO ACIDS; HARD X RADIATION; INTERFACES; LIQUIDS; MATHEMATICAL SOLUTIONS; MEMBRANES; POTENTIALS; SEMICONDUCTOR MATERIALS; SOLVENTS; SYNCHROTRON RADIATION SOURCES; THICKNESS; WATER; X-RAY PHOTOELECTRON SPECTROSCOPY