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Title: Electron density and electron temperature measurement in a bi-Maxwellian electron distribution using a derivative method of Langmuir probes

In plasma diagnostics with a single Langmuir probe, the electron temperature T{sub e} is usually obtained from the slope of the logarithm of the electron current or from the electron energy probability functions of current (I)-voltage (V) curve. Recently, Chen [F. F. Chen, Phys. Plasmas 8, 3029 (2001)] suggested a derivative analysis method to obtain T{sub e} by the ratio between the probe current and the derivative of the probe current at a plasma potential where the ion current becomes zero. Based on this method, electron temperatures and electron densities were measured and compared with those from the electron energy distribution function (EEDF) measurement in Maxwellian and bi-Maxwellian electron distribution conditions. In a bi-Maxwellian electron distribution, we found the electron temperature T{sub e} obtained from the method is always lower than the effective temperatures T{sub eff} derived from EEDFs. The theoretical analysis for this is presented.
Authors:
;  [1] ;  [2]
  1. Department of Electrical Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791 (Korea, Republic of)
  2. High-Enthalpy Plasma Research Center, Chonbuk National University, 567 Baekje-daero, Deokjin-gu, Jeonju, Jeollabuk-do 561-756 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22220689
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physics of Plasmas; Journal Volume: 20; Journal Issue: 8; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CURRENTS; DIELECTRIC PROPERTIES; DISTRIBUTION; ELECTRON DENSITY; ELECTRON TEMPERATURE; ELECTRONS; ENERGY SPECTRA; FUNCTIONS; ION TEMPERATURE; LANGMUIR PROBE; MAXWELL EQUATIONS; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA POTENTIAL; PROBABILITY