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Title: NAIS: Nuclear activation-based imaging spectroscopy

In recent years, the development of high power laser systems led to focussed intensities of more than 10{sup 22} W/cm{sup 2} at high pulse energies. Furthermore, both, the advanced high power lasers and the development of sophisticated laser particle acceleration mechanisms facilitate the generation of high energetic particle beams at high fluxes. The challenge of imaging detector systems is to acquire the properties of the high flux beam spatially and spectrally resolved. The limitations of most detector systems are saturation effects. These conventional detectors are based on scintillators, semiconductors, or radiation sensitive films. We present a nuclear activation-based imaging spectroscopy method, which is called NAIS, for the characterization of laser accelerated proton beams. The offline detector system is a combination of stacked metal foils and imaging plates (IP). After the irradiation of the stacked foils they become activated by nuclear reactions, emitting gamma decay radiation. In the next step, an autoradiography of the activated foils using IPs and an analysis routine lead to a spectrally and spatially resolved beam profile. In addition, we present an absolute calibration method for IPs.
Authors:
; ; ; ; ; ; ;  [1] ;  [2] ;  [3]
  1. Institut für Kernphysik, Schlossgartenstr. 9, Technische Universität Darmstadt, D-64289 Darmstadt (Germany)
  2. Central Laser Facility, Rutherford Appelton Laboratory, Chilton, Didcot, Oxon OX11 0QX (United Kingdom)
  3. GSI – Helmholtzzentrum für Schwerionenforschung GmbH, D-64291 Darmstadt (Germany)
Publication Date:
OSTI Identifier:
22220543
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 7; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; AUTORADIOGRAPHY; BEAM PROFILES; CALIBRATION; FOILS; GAMMA DECAY; LASERS; POSITION SENSITIVE DETECTORS; PROTON BEAMS; SEMICONDUCTOR MATERIALS; SPECTROSCOPY