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Title: Investigation of the effect of low energy ion beam irradiation on mono-layer graphene

In this paper, the effect of low energy irradiation on mono-layer graphene was studied. Mono-layer graphene films were irradiated with B, N and F ions at different energy and fluence. X-ray photoelectron spectroscopy indicates that foreign ions implanted at ion energies below 35 eV could dope into the graphene lattice and form new chemical bonds with carbon atoms. The results of Raman measurement indicate that ion beam irradiation causes defects and disorder to the graphene crystal structure, and the level of defects increases with increasing of ion energy and fluence. Surface morphology images also prove that ion beam irradiation creates damages to graphene film. The experiment results suggest that low-energy irradiation with energies of about 30 eV and fluences up to 5·10{sup 14} cm{sup −2} could realize small amount of doping, while introducing weak damage to graphene. Low energy ion beam irradiation, provides a promising approach for controlled doping of graphene.
Authors:
 [1] ;  [2] ;  [3] ; ; ;  [4] ;  [1] ;  [3]
  1. College of Physics science and technology, Soochow University, Suzhou215006 (China)
  2. (Germany)
  3. (China)
  4. II. Physikalisches Institut, Universität Göttingen, Friedrich- Hund- Platz 1, 37077 Göttingen (Germany)
Publication Date:
OSTI Identifier:
22220494
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 3; Journal Issue: 7; Other Information: (c) 2013 © 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; CHEMICAL BONDS; CRYSTAL STRUCTURE; DEFECTS; EV RANGE; FILMS; FLUORINE; GRAPHENE; ION BEAMS; IRRADIATION; LAYERS; RAMAN SPECTRA; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY