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Title: Structural evolution of Ga-Ge-Te glasses by combined EXAFS and XPS analysis

The structural evolution of Ga{sub x}Ge{sub y}Te{sub 100−x−y} glasses in the vicinity of GeTe{sub 4}-GaTe{sub 3} pseudo-binary tie-line is determined with high-resolution X-ray photoelectron (XPS) and extended X-ray absorption fine structure (EXAFS) spectroscopies. The analysis of XPS data is complicated by similar electronegativity values for the constituent chemical elements, but then the interpretation is facilitated by information from complementary EXAFS analysis of the structure around each element independently. The results show 4/4/2 coordination for Ga/Ge/Te atoms and absence of Ga(Ge)-Ge(Ga) bonds or extended Te clusters in significant concentrations within the whole range of studied composition. The observed structural features correlate well with the measured basic physical properties of Ga-containing germanium telluride glasses.
Authors:
 [1] ;  [2] ; ;  [3] ;  [4]
  1. Department of Physics and Astronomy, Austin Peay State University, Clarksville, Tennessee 37044 (United States)
  2. (United States)
  3. Laboratoire des Verres et Ceramiques, Institut des Sciences Chimiques de Rennes, UMR-CNRS6226, University of Rennes 1 (France)
  4. Materials Science and Engineering Department, Lehigh University, 5 East Packer Avenue, Bethlehem, Pennsylvania 18015 (United States)
Publication Date:
OSTI Identifier:
22220486
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Chemical Physics; Journal Volume: 139; Journal Issue: 5; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; ABSORPTION SPECTROSCOPY; ELECTRONEGATIVITY; FINE STRUCTURE; GALLIUM COMPOUNDS; GERMANIUM TELLURIDES; GLASS; PHYSICAL PROPERTIES; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY