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Title: Femtosecond photoelectron point projection microscope

By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect.
Authors:
; ;  [1]
  1. Department of Physics, Trinity College, 300 Summit St., Hartford, Connecticut 06106 (United States)
Publication Date:
OSTI Identifier:
22220389
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 10; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; COMPARATIVE EVALUATIONS; ELECTRON MICROSCOPES; ELECTRON PROBES; ELECTRON SOURCES; ELECTRONS; GEOMETRY; IMAGES; NANOSTRUCTURES; PARTICLES; PHOTOEMISSION; PHOTONS; SPATIAL RESOLUTION