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Title: SIMS instrumentation and methodology for mapping of co-localized molecules

We describe an innovative mode for localizing surface molecules. In this methodology, individual C{sub 60} impacts at 50 keV are localized using an electron emission microscope, EEM, synchronized with a time-of-flight mass spectrometer for the detection of the concurrently emitted secondary ions. The instrumentation and methodologies for generating ion maps are presented. The performance of the localization scheme depends on the characteristics of the electron emission, those of the EEM and of the software solutions for image analysis. Using 50 keV C{sub 60} projectiles, analyte specific maps and maps of co-emitted species have been obtained. The individual impact sites were localized within 1-2 μm. A distinctive feature of recording individual impacts is the ability to identify co-emitted ions which originate from molecules co-located within ∼10 nm.
Authors:
; ;  [1] ;  [2]
  1. Department of Chemistry, Texas A and M University, College Station, Texas 77843-3144 (United States)
  2. Institut de Physique Nucléaire d’Orsay, Université Paris-Sud 11, CNRS/IN2P3, F-91406 Orsay (France)
Publication Date:
OSTI Identifier:
22220388
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 10; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; COMPUTER CODES; ELECTRON EMISSION; FULLERENES; IMAGE PROCESSING; ION MICROPROBE ANALYSIS; MAPPING; MASS SPECTROSCOPY; MICROSCOPES; MOLECULES; PERFORMANCE; TIME-OF-FLIGHT MASS SPECTROMETERS