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Title: Multi-view fast-ion D-alpha spectroscopy diagnostic at ASDEX Upgrade

A novel fast-ion D-alpha (FIDA) diagnostic that is based on charge exchange spectroscopy has been installed at ASDEX Upgrade. The diagnostic uses a newly developed high-photon-throughput spectrometer together with a low-noise EM-CCD camera that allow measurements with 2 ms exposure time. Absolute intensities are obtained by calibrating the system with an integrating sphere and the wavelength dependence is determined to high accuracy using a neon lamp. Additional perturbative contributions to the spectra, such as D{sub 2}-molecular lines, the Stark broadened edge D-alpha emission, and passive FIDA radiation have been identified and can be subtracted or avoided experimentally. The FIDA radiation from fast deuterium ions after charge exchange reactions can therefore be analyzed continuously without superimposed line emissions at large Doppler shifts. Radial information on the fast ions is obtained from radially distributed lines of sight. The investigation of the fast-ion velocity distribution is possible due to three different viewing geometries. The independent viewing geometries access distinct parts of the fast-ion velocity space and make tomographic reconstructions possible.
Authors:
; ; ; ; ; ; ;  [1] ;  [2] ;
  1. Max-Planck-Institut für Plasmaphysik, EURATOM Association, Boltzmannstr. 2, 85748 Garching (Germany)
  2. Faculty of Physics, University of Seville, Seville (Spain)
Publication Date:
OSTI Identifier:
22220325
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 11; Other Information: (c) 2013 Euratom; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ACCURACY; ALPHA SPECTROSCOPY; ASDEX TOKAMAK; CHARGE EXCHANGE; CHARGE-COUPLED DEVICES; CHARGE-EXCHANGE REACTIONS; DEUTERIUM IONS; DIAGNOSTIC USES; DOPPLER EFFECT; EMISSION; FREQUENCY DEPENDENCE; GEOMETRY; NEON; PHOTONS; PLASMA DIAGNOSTICS; SENSORS; SPECTROMETERS