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Title: High-energy x-ray diffractometer for nondestructive strain depth profile measurement

We describe a lab-based high-energy x-ray diffraction system and a new approach to nondestructively measuring strain profiles in polycrystalline samples. This technique utilizes the tungsten K{sub α1} characteristic radiation from a standard industrial x-ray tube. We introduce a simulation model that is used to determine strain values from data collected with this system. Examples of depth profiling are shown for shot peened aluminum and titanium samples. Profiles to 1 mm depth in aluminum and 300 μm depth in titanium with a depth resolution of 20 μm are presented.
Authors:
 [1] ; ;  [2]
  1. Department of Physics, Yarmouk University, 21163 Irbid (Jordan)
  2. Center for Nondestructive Evaluation, Iowa State University, Ames, Iowa 50011 (United States)
Publication Date:
OSTI Identifier:
22220223
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 12; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALUMINIUM; DEPTH; NONDESTRUCTIVE TESTING; POLYCRYSTALS; RESOLUTION; STRAINS; TITANIUM; TUNGSTEN; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY TUBES