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Title: Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion

We show that the two-level systems (TLS) in lithographic superconducting circuits act as a power-dependent dielectric leading to non-linear responses in a parametrically coupled electromechanical system. Driven TLS shift the microwave resonance frequency and modulate the mechanical resonance through the optical spring effect. By pumping with two tones in a back-action evading measurement, these effects produce a mechanical parametric instability which limits single quadrature imprecision to 1.4 x{sub zp}. The microwave resonator noise is also consistent to a TLS-noise model. These observations suggest design strategies for minimizing TLS effects to improve ground-state cooling and quantum non-demolition measurements of motion.
Authors:
; ;  [1]
  1. Applied Physics, California Institute of Technology, Pasadena, California 91125 (United States)
Publication Date:
OSTI Identifier:
22218123
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 5; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DEMOLITION; DESIGN; DIELECTRIC MATERIALS; GROUND STATES; MICROWAVE RADIATION; NOISE; OPTICAL PUMPING; PARAMETRIC INSTABILITIES; RESONANCE; SUPERCONDUCTING CAVITY RESONATORS