skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion

Abstract

We show that the two-level systems (TLS) in lithographic superconducting circuits act as a power-dependent dielectric leading to non-linear responses in a parametrically coupled electromechanical system. Driven TLS shift the microwave resonance frequency and modulate the mechanical resonance through the optical spring effect. By pumping with two tones in a back-action evading measurement, these effects produce a mechanical parametric instability which limits single quadrature imprecision to 1.4 x{sub zp}. The microwave resonator noise is also consistent to a TLS-noise model. These observations suggest design strategies for minimizing TLS effects to improve ground-state cooling and quantum non-demolition measurements of motion.

Authors:
; ;  [1]
  1. Applied Physics, California Institute of Technology, Pasadena, California 91125 (United States)
Publication Date:
OSTI Identifier:
22218123
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 103; Journal Issue: 5; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DEMOLITION; DESIGN; DIELECTRIC MATERIALS; GROUND STATES; MICROWAVE RADIATION; NOISE; OPTICAL PUMPING; PARAMETRIC INSTABILITIES; RESONANCE; SUPERCONDUCTING CAVITY RESONATORS

Citation Formats

Suh, J., Weinstein, A. J., and Schwab, K. C. Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion. United States: N. p., 2013. Web. doi:10.1063/1.4816428.
Suh, J., Weinstein, A. J., & Schwab, K. C. Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion. United States. https://doi.org/10.1063/1.4816428
Suh, J., Weinstein, A. J., and Schwab, K. C. 2013. "Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion". United States. https://doi.org/10.1063/1.4816428.
@article{osti_22218123,
title = {Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion},
author = {Suh, J. and Weinstein, A. J. and Schwab, K. C.},
abstractNote = {We show that the two-level systems (TLS) in lithographic superconducting circuits act as a power-dependent dielectric leading to non-linear responses in a parametrically coupled electromechanical system. Driven TLS shift the microwave resonance frequency and modulate the mechanical resonance through the optical spring effect. By pumping with two tones in a back-action evading measurement, these effects produce a mechanical parametric instability which limits single quadrature imprecision to 1.4 x{sub zp}. The microwave resonator noise is also consistent to a TLS-noise model. These observations suggest design strategies for minimizing TLS effects to improve ground-state cooling and quantum non-demolition measurements of motion.},
doi = {10.1063/1.4816428},
url = {https://www.osti.gov/biblio/22218123}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 5,
volume = 103,
place = {United States},
year = {Mon Jul 29 00:00:00 EDT 2013},
month = {Mon Jul 29 00:00:00 EDT 2013}
}