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Title: The formation of double-row oxide stripes during the initial oxidation of NiAl(100)

The initial growth of ultrathin aluminum oxide film during the oxidation of NiAl(100) was studied with scanning tunneling microscopy. Our observations reveal that the oxide film grows initially as pairs of a double-row stripe structure with a lateral size equal to the unit cell of θ-Al{sub 2}O{sub 3}. These double-row stripes serve as the very basic stable building units of the ordered oxide phase for growing thicker bulk-oxide-like thin films. It is shown that the electronic properties of these ultrathin double-row stripes do not differ significantly from that of the clean NiAl surface; however, the thicker oxide stripes show a decreased conductivity.
Authors:
;  [1]
  1. Department of Mechanical Engineering and Multidisciplinary Program in Materials Science and Engineering, State University of New York, Binghamton, New York 13902 (United States)
Publication Date:
OSTI Identifier:
22218095
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 8; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM ALLOYS; ALUMINIUM OXIDES; ELECTRIC CONDUCTIVITY; NICKEL ALLOYS; OXIDATION; SCANNING TUNNELING MICROSCOPY; SURFACES; THIN FILMS