skip to main content

SciTech ConnectSciTech Connect

Title: X-rays from a microsecond X-pinch

The characteristics of x-rays emitted by X-pinches driven by discharging a current of ∼320 kA with a quarter period of 1 μs in crossed 25 μm wires have been investigated. The x-ray emissions are studied using filtered silicon photodiodes, diamond radiation detectors, and pinhole cameras. The results show that predominantly x-rays from the microsecond X-pinch tend to be emitted in two distinct sets of bursts. The first is predominantly “soft,” i.e., with photon energy hν < 5 keV, followed by a second set of bursts beginning up to 100 ns following the initial bursts, and usually consisting of higher photon energies. Our results show, however, that the x-ray emissions do not contain a significant component with hν > 10 keV as might be expected from electron beam activity within the plasma or from the X-pinch diode. High-resolution images obtained with the observed x-rays suggest a well-defined small source of soft x-rays that demonstrates the potential of the microsecond X-pinch.
Authors:
 [1]
  1. Department of Physics, Florida A and M University, Tallahassee, Florida 32307 (United States)
Publication Date:
OSTI Identifier:
22218091
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 8; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; CAMERAS; DIAMONDS; ELECTRIC CURRENTS; ELECTRON BEAMS; EMISSION; FILTERS; IMAGES; PHOTODIODES; PHOTONS; PINCH EFFECT; PLASMA DIAGNOSTICS; RADIATION DETECTORS; RESOLUTION; SILICON; SOFT X RADIATION