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Title: Epitaxial films of Heusler compound Co{sub 2}FeAl{sub 0.5}Si{sub 0.5} with high crystalline quality grown by off-axis sputtering

Co{sub 2}FeAl{sub 0.5}Si{sub 0.5} films with a surface roughness of 0.12 nm have been grown epitaxially on lattice-matched MgAl{sub 2}O{sub 4} (001) substrates by off-axis sputtering. X-ray diffraction shows pronounced Laue oscillations, rocking curves as narrow as 0.0043°, and clear Co{sub 2}FeAl{sub 0.5}Si{sub 0.5} (111) peaks indicating L2{sub 1} ordering. Magnetic characterizations show a clear magnetocrystalline anisotropy comprising cubic and epitaxy-induced uniaxial terms. Nuclear magnetic resonance measurements reveal L2{sub 1} order of 81% in the Co{sub 2}FeAl{sub 0.5}Si{sub 0.5} films. Magnetotransport measurements show a distinct separation of anisotropic magnetoresistance and ordinary magnetoresistance. These results demonstrate the state-of-the-art crystalline quality and magnetic uniformity of the Co{sub 2}FeAl{sub 0.5}Si{sub 0.5} films.
Authors:
; ;  [1] ; ;  [2] ;  [3] ; ;  [2] ;  [4]
  1. Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States)
  2. Leibniz Institute for Solid State and Materials Research Dresden, IFW, D-01171 Dresden (Germany)
  3. Department of Chemistry and Biochemistry, The Ohio State University, Columbus, Ohio 43210 (United States)
  4. (Germany)
Publication Date:
OSTI Identifier:
22217908
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 16; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM ALLOYS; ANISOTROPY; COBALT ALLOYS; DEPOSITION; EPITAXY; FILMS; IRON ALLOYS; MAGNETORESISTANCE; NEUTRON DIFFRACTION; NUCLEAR MAGNETIC RESONANCE; OSCILLATIONS; PEAKS; ROUGHNESS; SPUTTERING; SUBSTRATES; SURFACES; X-RAY DIFFRACTION