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Title: An approach to reduce the antiferromagnetic coupling of antiphase boundaries in half-metallic magnetite films

Highly conductive (∼10{sup 5} μΩ cm) Mn doped epitaxial Fe{sub 3}O{sub 4} films were fabricated by reactive sputtering. The larger size of magnetic domains compared to grain size with the increasing Mn content indicates that the partial antiferromagnetic coupling across the antiphase boundaries has been weakened, which was further demonstrated by the smaller exchange bias, faster saturated magnetization, and decreasing exchange interaction J{sub AF}. The decrease of antiferromagnetic strength originates from the larger Mn-O bond length than that of Fe-O bond. The first-principle calculation shows that the half-metallic feature (100% spin polarization) of Fe{sub 3}O{sub 4} was unchanged with the incorporation of Mn atoms.
Authors:
; ;  [1]
  1. Tianjin Key Laboratory of Low Dimensional Materials Physics and Preparing Technology, Institute of Advanced Materials Physics, Faculty of Science, Tianjin University, Tianjin 300072 (China)
Publication Date:
OSTI Identifier:
22217825
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 21; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; ATOMS; BOND LENGTHS; COUPLING; DOPED MATERIALS; EPITAXY; EXCHANGE INTERACTIONS; FERRITES; FILMS; GRAIN SIZE; IRON OXIDES; LAYERS; MAGNETITE; MAGNETIZATION; POLARIZATION; SPIN ORIENTATION; SPUTTERING