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Title: The pristine atomic structure of MoS{sub 2} monolayer protected from electron radiation damage by graphene

Materials can, in principle, be imaged at the level of individual atoms with aberration-corrected transmission electron microscopy. However, such resolution can be attained only with very high electron doses. Consequently, radiation damage is often the limiting factor when characterizing sensitive materials. Here, we demonstrate a simple and an effective method to increase the electron radiation tolerance of materials by using graphene as protective coating. This leads to an improvement of three orders of magnitude in the radiation tolerance of monolayer MoS{sub 2}. Further on, we construct samples in different heterostructure configurations to separate the contributions of different radiation damage mechanisms.
Authors:
; ; ; ;  [1]
  1. Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University (Germany)
Publication Date:
OSTI Identifier:
22217811
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 20; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CONFIGURATION; DOSES; ELECTRON BEAMS; ELECTRONS; GRAPHENE; IMAGES; MOLYBDENUM SULFIDES; PROTECTIVE COATINGS; RADIATION EFFECTS; RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY