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Title: Femtosecond laser-induced periodic surface structure on the Ti-based nanolayered thin films

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4848016· OSTI ID:22217784
; ;  [1];  [2];  [3];  [4];  [2];  [5]
  1. Institute of Nuclear Science—Vinča, University of Belgrade, POB 522, 11001 Belgrade (Serbia)
  2. Institute of Electronic Structure and Laser, Foundation for Research and Technology–Hellas, P.O. Box 1527, Gr-711 10 Heraklion (Greece)
  3. Ruđer Bošković Institute, P.O. Box 180, 10002 Zagreb (Croatia)
  4. Jožef Stefan Institute, Jamova 39, 1000 Ljubljana (Slovenia)
  5. Institute of Physics, University of Belgrade, Pregrevica 118, 11080 Belgrade (Serbia)

Laser-induced periodic surface structures (LIPSSs) and chemical composition changes of Ti-based nanolayered thin films (Al/Ti, Ni/Ti) after femtosecond (fs) laser pulses action were studied. Irradiation is performed using linearly polarized Ti:Sapphire fs laser pulses of 40 fs pulse duration and 800 nm wavelength. The low spatial frequency LIPSS (LSFL), oriented perpendicular to the laser polarization with periods slightly lower than the irradiation wavelength, was typically formed at elevated laser fluences. On the contrary, high spatial frequency LIPSS (HSFL) with uniform period of 155 nm, parallel to the laser light polarization, appeared at low laser fluences, as well as in the wings of the Gaussian laser beam distribution for higher used fluence. LSFL formation was associated with the material ablation process and accompanied by the intense formation of nanoparticles, especially in the Ni/Ti system. The composition changes at the surface of both multilayer systems in the LSFL area indicated the intermixing between layers and the substrate. Concentration and distribution of all constitutive elements in the irradiated area with formed HSFLs were almost unchanged.

OSTI ID:
22217784
Journal Information:
Journal of Applied Physics, Vol. 114, Issue 23; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English