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Title: The role of oxygen in the uptake of deuterium in lithiated graphite

We investigate the mechanism of deuterium retention by lithiated graphite and its relationship to the oxygen concentration through surface sensitive experiments and atomistic simulations. Deposition of lithium on graphite yielded 5%–8% oxygen surface concentration and when subsequently irradiated with D ions at energies between 500 and 1000 eV/amu and fluences over 10{sup 16} cm{sup −2} the oxygen concentration rose to between 25% and 40%. These enhanced oxygen levels were reached in a few seconds compared to about 300 h when the lithiated graphite was allowed to adsorb oxygen from the ambient environment under equilibrium conditions. Irradiating graphite without lithium deposition, however, resulted in complete removal of oxygen to levels below the detection limit of XPS (e.g., <1%). These findings confirm the predictions of atomistic simulations, which had concluded that oxygen was the primary component for the enhanced hydrogen retention chemistry on the lithiated graphite surface.
Authors:
;  [1] ;  [2] ;  [1] ;  [3] ;  [2] ;  [3] ;  [3] ;  [4]
  1. School of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)
  2. Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37998 (United States)
  3. (United States)
  4. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
Publication Date:
OSTI Identifier:
22217772
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 22; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ADSORPTION; DEPOSITION; DEUTERIUM IONS; EQUILIBRIUM; EV RANGE; GRAPHITE; HYDROGEN; ION BEAMS; IRRADIATION; LITHIUM; OXYGEN; REMOVAL; SENSITIVITY; SIMULATION; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY; YIELDS