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Title: In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO{sub 3} thin films

In-situ synchrotron x-ray diffraction was performed during the growth of BaTiO{sub 3} thin films on SrTiO{sub 3} substrates using both off-axis RF magnetron sputtering and pulsed laser deposition techniques. It was found that the films were ferroelectric during the growth process, and the presence or absence of a bottom SrRuO{sub 3} electrode played an important role in the growth of the films. Pulsed laser deposited films on SrRuO{sub 3} displayed an anomalously high tetragonality and unit volume, which may be connected to the previously predicted negative pressure phase of BaTiO{sub 3}.
Authors:
; ; ; ;  [1] ; ; ;  [2]
  1. Department of Physics and Astronomy, Stony Brook University, Stony Brook, New York 11794-3800 (United States)
  2. Department of Physics, Cook Physical Science Building, University of Vermont, Burlington, Vermont 05405 (United States)
Publication Date:
OSTI Identifier:
22217755
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 24; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BARIUM COMPOUNDS; DEPOSITS; ELECTROCHEMISTRY; ELECTRODES; ENERGY BEAM DEPOSITION; EPITAXY; FERROELECTRIC MATERIALS; LASER RADIATION; LASERS; MAGNETRONS; PULSED IRRADIATION; SPUTTERING; STRAINS; STRONTIUM TITANATES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION