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Title: High-temperature structural phase transition in the LiCu{sub 2}O{sub 2} multiferroic

The results of thermogravimetric, X-ray diffraction, and electrical studies of LiCu{sub 2}O{sub 2} single crystals in the temperature range 300-1100 K are presented. A reversible first-order phase transition between the orthorhombic and tetragonal phases is found to occur in these single crystals at T = 993 K. A pronounced peak on a differential thermal analysis curve and jumps in the unit cell parameters and the electrical resistivity are detected at the phase-transition temperature. The data on the crystal structure of LiCu{sub 2}O{sub 2} and the phase transition-induced change in the entropy determined in this work are used to conclude that the revealed phase transition is caused by the ordering-disordering of Li{sup +} and Cu{sup 2+} cations in their structural positions.
Authors:
;  [1] ;  [2] ;  [3] ;  [4] ; ;  [5]
  1. Moscow State Institute of Radio Engineering, Electronics, and Automation (Technical University) (Russian Federation)
  2. Russian Academy of Sciences, Kapitza Institute for Physical Problems (Russian Federation)
  3. Karpov Research Institute of Physical Chemistry (Russian Federation)
  4. Uppsala University, Department of Chemistry (Sweden)
  5. Uppsala University, Department of Engineering Sciences (Sweden)
Publication Date:
OSTI Identifier:
22210509
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Experimental and Theoretical Physics; Journal Volume: 117; Journal Issue: 2; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CATIONS; COPPER IONS; DIFFERENTIAL THERMAL ANALYSIS; ELECTRIC CONDUCTIVITY; ENTROPY; LITHIUM IONS; MONOCRYSTALS; ORTHORHOMBIC LATTICES; PHASE TRANSFORMATIONS; TEMPERATURE RANGE 0400-1000 K; THERMAL GRAVIMETRIC ANALYSIS; TRANSITION TEMPERATURE; X-RAY DIFFRACTION