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Title: Islands stretch test for measuring the interfacial fracture energy between a hard film and a soft substrate

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4810763· OSTI ID:22163024
 [1];  [2];  [3];  [1];  [1]
  1. School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138 (United States)
  2. Research Center for Mechanics of Solids, Structures and Materials, Department of Aerospace Engineering and Engineering Mechanics, University of Texas at Austin, Austin, Texas 78712 (United States)
  3. Department of Material Science and Engineering, Seoul National University, Seoul 151-742 (Korea, Republic of)

We present a technique for measuring the interfacial fracture energy, {Gamma}{sub i}, between a hard thin film and a soft substrate. A periodic array of hard thin islands is fabricated on a soft substrate, which is then subjected to uniaxial tension under an optical microscope. When the applied strain reaches a critical value, delamination between the islands and the substrate starts from the edge of the islands. As the strain is increased, the interfacial cracks grow in a stable fashion. At a given applied strain, the width of the delaminated region is a unique function of the interfacial fracture energy. We have calculated the energy release rate driving the delamination as a function of delamination width, island size, island thickness, and applied strain. For a given materials system, this relationship allows determination of the interfacial fracture energy from a measurement of the delamination width. The technique is demonstrated by measuring the interfacial fracture energy of plasma-enhanced chemical vapor deposition SiN{sub x} islands on a polyimide substrate. We anticipate that this technique will find application in the flexible electronics industry where hard islands on soft substrates are a common architecture to protect active devices from fracture.

OSTI ID:
22163024
Journal Information:
Journal of Applied Physics, Vol. 113, Issue 22; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English