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Title: Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response

The effects of irradiation by X rays and protons on the dielectric and piezoelectric response of highly (100)-textured polycrystalline Pb(Zr{sub x}Ti{sub 1-x})O{sub 3} (PZT) thin films have been studied. Low-field dielectric permittivity, remanent polarization, and piezoelectric d{sub 33,f} response all degraded with exposure to radiation, for doses higher than 300 krad. At first approximation, the degradation increased at higher radiation doses, and was stronger in samples exposed to X rays, compared to the proton-irradiated ones. Nonlinear and high-field dielectric characterization suggest a radiation-induced reduction of the extrinsic contributions to the response, attributed to increased pinning of the domain walls by the radiation-induced point defects.
Authors:
; ;  [1] ; ; ;  [2] ;  [1] ;  [3]
  1. G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)
  2. DEI-Department of Information Engineering, University of Padova, Padova 35131 (Italy)
  3. (United States)
Publication Date:
OSTI Identifier:
22162922
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 102; Journal Issue: 19; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APPROXIMATIONS; COMPARATIVE EVALUATIONS; FERROELECTRIC MATERIALS; IRRADIATION; LEAD COMPOUNDS; OZONE; PERMITTIVITY; PIEZOELECTRICITY; POINT DEFECTS; POLARIZATION; POLYCRYSTALS; PROTON BEAMS; PZT; RADIATION DOSES; TEXTURE; THIN FILMS; TITANATES; X RADIATION; ZIRCONATES