Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods
Abstract
A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.
- Authors:
-
- Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
- Publication Date:
- OSTI Identifier:
- 22156475
- Resource Type:
- Journal Article
- Journal Name:
- Crystallography Reports
- Additional Journal Information:
- Journal Volume: 58; Journal Issue: 1; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7745
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; COMPARATIVE EVALUATIONS; CRYSTALS; ELECTRIC FIELDS; GALLIUM; LANTHANUM; LATTICE PARAMETERS; PIEZOELECTRICITY; X RADIATION; X-RAY DIFFRACTION
Citation Formats
Blagov, A. E., Marchenkov, N. V., E-mail: marchenkov@ns.crys.ras.ru, Pisarevsky, Yu. V., Prosekov, P. A., and Kovalchuk, M. V. Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. United States: N. p., 2013.
Web. doi:10.1134/S1063774513010057.
Blagov, A. E., Marchenkov, N. V., E-mail: marchenkov@ns.crys.ras.ru, Pisarevsky, Yu. V., Prosekov, P. A., & Kovalchuk, M. V. Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. United States. https://doi.org/10.1134/S1063774513010057
Blagov, A. E., Marchenkov, N. V., E-mail: marchenkov@ns.crys.ras.ru, Pisarevsky, Yu. V., Prosekov, P. A., and Kovalchuk, M. V. 2013.
"Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods". United States. https://doi.org/10.1134/S1063774513010057.
@article{osti_22156475,
title = {Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods},
author = {Blagov, A. E. and Marchenkov, N. V., E-mail: marchenkov@ns.crys.ras.ru and Pisarevsky, Yu. V. and Prosekov, P. A. and Kovalchuk, M. V.},
abstractNote = {A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.},
doi = {10.1134/S1063774513010057},
url = {https://www.osti.gov/biblio/22156475},
journal = {Crystallography Reports},
issn = {1063-7745},
number = 1,
volume = 58,
place = {United States},
year = {Tue Jan 15 00:00:00 EST 2013},
month = {Tue Jan 15 00:00:00 EST 2013}
}
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