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Title: High-quality Bi{sub 2}Te{sub 3} thin films grown on mica substrates for potential optoelectronic applications

We report high-quality topological insulator Bi{sub 2}Te{sub 3} thin films grown on muscovite mica substrates by molecular beam epitaxy. The topographic and structural analysis revealed that the Bi{sub 2}Te{sub 3} thin films exhibited atomically smooth terraces over a large area and a high crystalline quality. Both weak antilocalization effect and quantum oscillations were observed in the magnetotransport of the relatively thin samples. A phase coherence length of 277 nm for a 6 nm thin film and a high surface mobility of 0.58 m{sup 2} V{sup -1} s{sup -1} for a 4 nm thin film were achieved. These results confirm that the thin films grown on mica are of high quality.
Authors:
;  [1] ;  [2] ; ; ;  [1] ; ;  [3] ; ; ;  [4] ;  [5] ; ;  [6] ;  [7] ;  [8]
  1. State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433 (China)
  2. (United States)
  3. Department of Electrical and Computer Engineering, Iowa State University, Ames, Iowa 50011 (United States)
  4. Device Research Laboratory, Department of Electrical Engineering, University of California, Los Angeles, California 90095 (United States)
  5. Materials Engineering, The University of Queensland, Brisbane QLD 4072 (Australia)
  6. Department of Physics, University of California, San Diego, California 92093 (United States)
  7. Materials Engineering, University of Queensland, Brisbane QLD 4072 (Australia)
  8. (Australia)
Publication Date:
OSTI Identifier:
22122814
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 3; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BISMUTH TELLURIDES; CARRIER MOBILITY; COHERENCE LENGTH; LAYERS; MOLECULAR BEAM EPITAXY; MUSCOVITE; OSCILLATIONS; SEMICONDUCTOR MATERIALS; SUBSTRATES; SURFACES; THIN FILMS; TOPOGRAPHY