skip to main content

Title: AlP/GaP distributed Bragg reflectors

Distributed Bragg reflectors with high reflectivity bands centered at wavelengths from 530 to 690 nm (green to red) based on AlP/GaP quarter-wave stacks are prepared on (001)GaP using gas-source molecular-beam epitaxy. Additionally, the complex refractive index of AlP is measured using spectroscopic ellipsometry within the range of 330-850 nm in order to facilitate an accurate reflector design. Structures consisting of 15 quarter-wave stacks reach a peak reflectance between 95% and 98%, depending on the spectral position of the maximum.
Authors:
; ;  [1] ;  [2]
  1. Department of Physics, Humboldt-Universitaet zu Berlin, Newtonstrasse 15, D-12489 Berlin (Germany)
  2. Sentech Instruments GmbH, Schwarzschildstr. 2, 12489 Berlin (Germany)
Publication Date:
OSTI Identifier:
22122812
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 3; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALUMINIUM PHOSPHIDES; BRAGG REFLECTION; ELLIPSOMETRY; GALLIUM PHOSPHIDES; MOLECULAR BEAM EPITAXY; PEAKS; REFLECTIVITY; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; WAVELENGTHS