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Title: Study of surfactant mediated growth of Ni/V superlattices

The Ni/V multilayers are useful as soft x-ray mirrors, polarizers, and phase retarders. For these applications, it is necessary that the interfaces roughness and interdiffusion must be as small as possible. The V-on-Ni and Ni-on-V interfaces are asymmetric due to the difference in the surface free energy of Ni and V. In this work, we report Ag surfactant mediated growth of Ni/V superlattices prepared using ion beam sputter deposition technique. These superlattices were studied using x-ray and neutron scattering techniques. It was found that when added in an optimum amount, Ag surfactant results in reduced interface roughness and interdiffusion across the interfaces. Obtained results can be understood with the surfactant floating-off mechanism leading to a balance in the surface free energy of Ni and V.
Authors:
; ; ;  [1] ;  [2]
  1. UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 001 (India)
  2. Laboratory for Neutron Scattering, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)
Publication Date:
OSTI Identifier:
22122805
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 2; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; ASYMMETRY; DEPOSITION; INTERFACES; ION BEAMS; LAYERS; NEUTRON DIFFRACTION; NICKEL; SILVER; SPUTTERING; SUPERLATTICES; SURFACE ENERGY; SURFACES; SURFACTANTS; VANADIUM; X RADIATION; X-RAY DIFFRACTION