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Title: Absolute spectral characterization of silicon barrier diode: Application to soft X-ray fusion diagnostics at Tore Supra

This paper presents an experimental protocol for absolute calibration of photo-detectors. Spectral characterization is achieved by a methodology that unlike the usual line emissions-based method, hinges on the Bremsstrahlung radiation of a Soft X-Ray (SXR) tube only. Although the proposed methodology can be applied virtually to any detector, the application presented in this paper is based on Tore Supra's SXR diagnostics, which uses Silicon Surface Barrier Diodes. The spectral response of these n-p junctions had previously been estimated on a purely empirical basis. This time, a series of second-order effects, like the spatial distribution of the source radiated power or multi-channel analyser non linearity, are taken into account to achieve accurate measurements. Consequently, a parameterised physical model is fitted to experimental results and the existence of an unexpected dead layer (at least 5 {mu}m thick) is evidenced. This contribution also echoes a more general on-going effort in favour of long-term quality of passive radiation measurements on Tokamaks.
Authors:
; ;  [1]
  1. CEA, IRFM, F-13108 Saint-Paul-lez-Durance (France)
Publication Date:
OSTI Identifier:
22122796
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 2; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BREMSSTRAHLUNG; CALIBRATION; ELECTRIC CONTACTS; EMISSION; LAYERS; MULTI-CHANNEL ANALYZERS; PHOTODETECTORS; PHOTODIODES; PLASMA DIAGNOSTICS; SEMICONDUCTOR JUNCTIONS; SILICON; SOFT X RADIATION; SPATIAL DISTRIBUTION; SPECTRAL RESPONSE; SUPERCONDUCTING JUNCTIONS; SURFACES; TORE SUPRA TOKAMAK