Positron annihilation spectroscopy techniques applied to the study of an HPGe detector

Journal Article · Mon May 06 00:00:00 EDT 2013 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4804096· OSTI ID:22111932

Nascimento, E. do; Vanin, V. R.; Maidana, N. L.; Silva, T. F.; Rizzutto, M. A. ^[1]; Fernandez-Varea, J. M. ^[2]

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1. Instituto de Fisica, Universidade de Sao Paulo, Sao Paulo, SP (Brazil)
2. Facultat de Fisica (ECM), Universitat de Barcelona, Diagonal 645, E-08028 Barcelona (Spain)

Doppler Broadening Spectroscopy of the large Ge crystal of an HPGe detector was performed using positrons from pair production of 6.13 MeV {gamma}-rays from the {sup 19}F(p,{alpha}{gamma}){sup 16}O reaction. Two HPGe detectors facing opposite sides of the Ge crystal acting as target provided both coincidence and singles spectra. Changes in the shape of the annihilation peak were observed when the high voltage applied to the target detector was switched on or off, amounting to somewhat less than 20% when the areas of equivalent energy intervals in the corresponding normalized spectra are compared.

• OSTI ID: 22111932
• Journal Information: AIP Conference Proceedings, Vol. 1529, Issue 1; Conference: 35. Brazilian workshop on nuclear physics, Sao Paulo (Brazil), 2-6 Sep 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNIHILATION
COINCIDENCE SPECTROMETRY
COMPARATIVE EVALUATIONS
CRYSTALS
DOPPLER BROADENING
EMISSION SPECTRA
FLUORINE 19 TARGET
GAMMA SPECTRA
GAMMA SPECTROSCOPY
HIGH-PURITY GE DETECTORS
MEV RANGE
OXYGEN 16
PAIR PRODUCTION
POSITRONS
PROTON REACTIONS