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Title: X-ray small-angle scattering from sputtered CeO{sub 2}/C bilayers

Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.
Authors:
; ; ; ; ;  [1] ; ; ;  [2] ;  [3] ;  [4]
  1. Department of Surface and Plasma Science, Faculty of Mathematics and Physics Charles University, V Holesovickach 2, 180 00, Prague 8 (Czech Republic)
  2. Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2 (Czech Republic)
  3. Institute Ruder Boskovic, Bijenicka 54, 10000 Zagreb (Croatia)
  4. Sincrotrone ELETTRA, 34149 Basovizza, Trieste (Italy)
Publication Date:
OSTI Identifier:
22102208
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 113; Journal Issue: 2; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; CARBON; CATALYSTS; CERIUM OXIDES; DEPOSITION; INTERFACES; LAYERS; METALS; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; SPUTTERING; SURFACES; THICKNESS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION