X-ray small-angle scattering from sputtered CeO{sub 2}/C bilayers

Journal Article · Mon Jan 14 00:00:00 EST 2013 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4773446· OSTI ID:22102208

Haviar, S.; Dubau, M.; Khalakhan, I.; Vorokhta, M.; Matolinova, I.; Matolin, V. ^[1]; Vales, V.; Endres, J.; Holy, V. ^[2]; Buljan, M. ^[3]; Bernstorff, S. ^[4]

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1. Department of Surface and Plasma Science, Faculty of Mathematics and Physics Charles University, V Holesovickach 2, 180 00, Prague 8 (Czech Republic)
2. Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2 (Czech Republic)
3. Institute Ruder Boskovic, Bijenicka 54, 10000 Zagreb (Croatia)
4. Sincrotrone ELETTRA, 34149 Basovizza, Trieste (Italy)

Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.

• OSTI ID: 22102208
• Journal Information: Journal of Applied Physics, Vol. 113, Issue 2; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
CARBON
CATALYSTS
CERIUM OXIDES
DEPOSITION
INTERFACES
LAYERS
METALS
SCANNING ELECTRON MICROSCOPY
SMALL ANGLE SCATTERING
SPUTTERING
SURFACES
THICKNESS
THIN FILMS
X RADIATION
X-RAY DIFFRACTION