Design and fabrication of a multi-purpose soft x-ray array diagnostic system for KSTAR

Journal Article · Mon Oct 15 00:00:00 EDT 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4734035· OSTI ID:22093955

Lee, Seung Hun; Chai, Kil Byoung; Jang, Siwon; Choe, Wonho ^[1]; Ko, Won-Ha; Kim, Junghee; Seo, Dongcheol; Lee, Jongha ^[2]; Bogatu, I. N.; Kim, Jin-Soo ^[3]

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1. Department of Physics, Korea Advanced Institute of Science and Technology 291 Daehak-ro, Yuseong-gu, Daejeon 305-701 (Korea, Republic of)
2. National Fusion Research Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 305-806 (Korea, Republic of)
3. FAR-TECH, Inc., 10350 Science Center Drive, Building 14, Suite 150, San Diego, California 92121-1136 (United States)

A multi-purpose soft x-ray array diagnostic system was developed for measuring two-dimensional x-ray emissivity profile, electron temperature, Ar impurity transport, and total radiation power. A remotely controlled filter wheel was designed with three different choices of filters. The electron temperature profile can be determined from the ratio of two channels having different thickness of Be layer, and the Ar impurity concentration transport can be determined from a pair of Ar Ross filters (CaF{sub 2} and NaCl thin films). Without any filters, this diagnostic system can also be used as a bolometer.

• OSTI ID: 22093955
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BOLOMETERS
CALCIUM FLUORIDES
CONFINEMENT
DESIGN
ELECTRON TEMPERATURE
EMISSIVITY
EQUIPMENT
FABRICATION
ION TEMPERATURE
PLASMA
PLASMA DIAGNOSTICS
PLASMA IMPURITIES
SODIUM CHLORIDES
SOFT X RADIATION
TEMPERATURE MEASUREMENT
THICKNESS
THIN FILMS
TOKAMAK DEVICES