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Title: Shot-to-shot reproducibility of a self-magnetically insulated ion diode

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4737186· OSTI ID:22093661
; ;  [1]
  1. Tomsk Polytechnic University, 30 Lenin Ave., Tomsk, 634050 (Russian Federation)

In this paper we present the analysis of shot to shot reproducibility of the ion beam which is formed by a self-magnetically insulated ion diode with an explosive emission graphite cathode. The experiments were carried out with the TEMP-4M accelerator operating in double-pulse mode: the first pulse is of negative polarity (300-500 ns, 100-150 kV), and this is followed by a second pulse of positive polarity (150 ns, 250-300 kV). The ion current density was 10-70 A/cm{sup 2} depending on the diode geometry. The beam was composed from carbon ions (80%-85%) and protons. It was found that shot to shot variation in the ion current density was about 35%-40%, whilst the diode voltage and current were comparatively stable with the variation limited to no more than 10%. It was shown that focusing of the ion beam can improve the stability of the ion current generation and reduces the variation to 18%-20%. In order to find out the reason for the shot-to-shot variation in ion current density we examined the statistical correlation between the current density of the accelerated beam and other measured characteristics of the diode, such as the accelerating voltage, total current, and first pulse duration. The correlation between the ion current density measured simultaneously at different positions within the cross-section of the beam was also investigated. It was shown that the shot-to-shot variation in ion current density is mainly attributed to the variation in the density of electrons diffusing from the drift region into the A-K gap.

OSTI ID:
22093661
Journal Information:
Review of Scientific Instruments, Vol. 83, Issue 7; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English