Time-domain sampling of x-ray pulses using an ultrafast sample response

Journal Article · Mon Dec 10 00:00:00 EST 2012 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4769828· OSTI ID:22089594

Gaal, P.; Shayduk, R. ^[1]; Schick, D.; Herzog, M.; Bojahr, A.; Goldshteyn, J.; Navirian, H. A.; Leitenberger, W. ^[2]; Vrejoiu, I. ^[3]; Khakhulin, D.; Wulff, M. ^[4]; Bargheer, M. ^[1]

---

1. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Wilhelm-Conrad-Roentgen Campus, BESSY II, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
2. Institut fuer Physik und Astronomie, Universitaet Potsdam, Karl-Liebknecht-Str. 24-25, 14476 Potsdam (Germany)
3. Max-Planck-Institut fuer Mikrostrukturphysik, Weinberg 2, 06120 Halle (Germany)
4. European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, 38000 Grenoble (France)

We employ the ultrafast response of a 15.4 nm thin SrRuO{sub 3} layer grown epitaxially on a SrTiO{sub 3} substrate to perform time-domain sampling of an x-ray pulse emitted from a synchrotron storage ring. Excitation of the sample with an ultrashort laser pulse triggers coherent expansion and compression waves in the thin layer, which turn the diffraction efficiency on and off at a fixed Bragg angle during 5 ps. This is significantly shorter than the duration of the synchrotron x-ray pulse of 100 ps. Cross-correlation measurements of the ultrafast sample response and the synchrotron x-ray pulse allow to reconstruct the x-ray pulse shape.

• OSTI ID: 22089594
• Journal Information: Applied Physics Letters, Vol. 101, Issue 24; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BEAMS
BRAGG REFLECTION
CORRELATIONS
EPITAXY
EXCITATION
EXPANSION
LAYERS
OXYGEN COMPOUNDS
PULSE SHAPERS
RUTHENIUM COMPOUNDS
SAMPLING
STORAGE RINGS
STRONTIUM COMPOUNDS
STRONTIUM TITANATES
SUBSTRATES
SYNCHROTRONS
THIN FILMS
X RADIATION
X-RAY DIFFRACTION