Quantitative measurement of hard x-ray spectra for high intensity laser produced plasma

Journal Article · Tue May 15 00:00:00 EDT 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4717677· OSTI ID:22072304

Zhang, Z; Nishimura, H; Namimoto, T; Fujioka, S; Arikawa, Y; Hosoda, H; Azechi, H ^[1]; Nishikino, M; Kawachi, T; Sagisaka, A; Orimo, S; Ogura, K; Pirozhkov, A; Yogo, A; Kiriyama, H; Kondo, K ^[2]; Okano, Y ^[3]; Ohshima, S ^[1]

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1. Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan)
2. Quantum Beam Science Directorate, Kansai Photon Science Institute, JAEA, Kyoto 619-0215 (Japan)
3. Laser Research Center for Molecular Science, Institute for Molecular Science, National Institute of Natural Science 38 Nishigo-Naka, Myodaiji, Okazaki 444-8585 (Japan)

X-ray line spectra ranging from 17 to 77 keV were quantitatively measured with a Laue spectrometer, composed of a cylindrically curved crystal and a detector. Either a visible CCD detector coupled with a CsI phosphor screen or an imaging plate can be chosen, depending on the signal intensities and exposure times. The absolute sensitivity of the spectrometer system was calibrated using pre-characterized laser-produced x-ray sources and radioisotopes. The integrated reflectivity for the crystal is in good agreement with predictions by an open code for x-ray diffraction. The energy transfer efficiency from incident laser beams to hot electrons, as the energy transfer agency for specific x-ray line emissions, is derived as a consequence of this work.

• OSTI ID: 22072304
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 5; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CHARGE-COUPLED DEVICES
CRYSTALS
ENERGY TRANSFER
HARD X RADIATION
KEV RANGE
LASER-PRODUCED PLASMA
LAUE METHOD
PHOTON BEAMS
RADIOISOTOPES
REFLECTIVITY
SCREENS
SENSITIVITY
SPECTROMETERS
X-RAY DIFFRACTION
X-RAY SOURCES
X-RAY SPECTRA