Development of the method for the preparation of Mg{sub 2}Si by SPS technique
- Thermoelectric Research Laboratory, Department of Inorganic Chemistry, Faculty of Materials Science and Ceramics, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow (Poland)
The aim of the study was to develop a fast and simple method for preparation of polycrystalline Mg{sub 2}Si. For this purpose a Spark Plasma Sintering (SPS) method was used and synthesis conditions were adjusted in such a manner that no excess Mg was required. Materials were synthesized by the direct reaction of Mg and Si raw powders. To determine the phase and chemical composition, the fabricated samples were studied by X-ray diffraction and SEM microscopy coupled with EDX chemical analysis. Thermoelectric properties of samples (thermal conductivity, electrical conductivity and Seebeck coefficient) were measured all over temperature range of 300-650 K. The analysis by the scanning thermoelectric microprobe (STM) shows that samples have uniform distribution of Seebeck coefficient with mean value of about -405 {mu}VK{sup -1} and standard deviation of 94 {mu}VK{sup -1}. Prepared materials have intrinsic band gap of 0.45 eV and thermal conductivity {lambda}= 7.5 Wm{sup -1}K{sup -1} at room temperature.
- OSTI ID:
- 22068981
- Journal Information:
- AIP Conference Proceedings, Vol. 1449, Issue 1; Conference: ECT2011: 9. European conference on thermoelectrics, Thessaloniki (Greece), 28-30 Sep 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CARRIER DENSITY
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
ELECTRIC CONDUCTIVITY
ENERGY GAP
MAGNESIUM SILICIDES
PLASMA
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SEEBECK EFFECT
SEMICONDUCTOR MATERIALS
SINTERING
SYNTHESIS
THERMAL CONDUCTIVITY
THERMOELECTRIC PROPERTIES
X-RAY DIFFRACTION