X-ray diffraction in the pulsed laser heated diamond anvil cell
- Geophysical Laboratory, Carnegie Institution of Washington, 5251 Broad Branch Rd., NW, Washington, DC 20015 (United States)
- Center for Advanced Radiation Sources, University of Chicago, Chicago, Illinois 60637 (United States)
We have developed in situ x-ray synchrotron diffraction measurements of samples heated by a pulsed laser in the diamond anvil cell at pressure up to 60 GPa. We used an electronically modulated 2-10 kHz repetition rate, 1064-1075 nm fiber laser with 1-100 {mu}s pulse width synchronized with a gated x-ray detector (Pilatus) and time-resolved radiometric temperature measurements. This enables the time domain measurements as a function of temperature in a microsecond time scale (averaged over many events, typically more than 10 000). X-ray diffraction data, temperature measurements, and finite element calculations with realistic geometric and thermochemical parameters show that in the present experimental configuration, samples 4 {mu}m thick can be continuously temperature monitored (up to 3000 K in our experiments) with the same level of axial and radial temperature uniformities as with continuous heating. We find that this novel technique offers a new and convenient way of fine tuning the maximum sample temperature by changing the pulse width of the laser. This delicate control, which may also prevent chemical reactivity and diffusion, enables accurate measurement of melting curves, phase changes, and thermal equations of state.
- OSTI ID:
- 22068439
- Journal Information:
- Review of Scientific Instruments, Vol. 81, Issue 11; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DIAMONDS
DIFFUSION
EQUATIONS OF STATE
FINITE ELEMENT METHOD
HEATING
KHZ RANGE
LASERS
MELTING
PRESSURE RANGE GIGA PA
PULSES
RADIOMETRIC ANALYSIS
REACTIVITY
SYNCHROTRONS
TEMPERATURE DEPENDENCE
TEMPERATURE MEASUREMENT
TIME RESOLUTION
X-RAY DIFFRACTION