Contribution to crystallographic slip assessment by means of topographic measurements achieved with atomic force microscopy

Journal Article · Wed Sep 15 00:00:00 EDT 2010 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2010.04.011· OSTI ID:22066271

Kahloun, C ^[1]; Badji, R ^[1]; Bacroix, B ^[1]; Bouabdallah, M ^[2]

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1. LPMTM - CNRS, Universite Paris 13, 99 av. J.B. Clement, 93430 Villetaneuse (France)
2. E.N.P, 10 av. Hassan Badi, 16200 El Harrah Alger (Algeria)

In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.

• OSTI ID: 22066271
• Journal Information: Materials Characterization, Vol. 61, Issue 9; Other Information: Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
CRYSTALLOGRAPHY
DEFORMATION
PLASTICITY
SLIP
STAINLESS STEELS
TENSILE PROPERTIES