skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: High resolution extreme ultraviolet spectrometer for an electron beam ion trap

Abstract

An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.

Authors:
; ;  [1];  [2]
  1. Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo 182-8585 (Japan)
  2. National Institute for Fusion Science, Toki, Gifu 509-5292 (Japan)
Publication Date:
OSTI Identifier:
22063695
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 82; Journal Issue: 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DIFFRACTION GRATINGS; ELECTRON BEAMS; EXTREME ULTRAVIOLET RADIATION; GRATINGS; INCIDENCE ANGLE; ION BEAMS; IONS; PERFORMANCE; RESOLUTION; SPHERICAL CONFIGURATION; TRAPS; ULTRAVIOLET SPECTROMETERS; VISIBLE RADIATION; WAVELENGTHS

Citation Formats

Ohashi, Hayato, Yatsurugi, Junji, Nakamura, Nobuyuki, and Sakaue, Hiroyuki A. High resolution extreme ultraviolet spectrometer for an electron beam ion trap. United States: N. p., 2011. Web. doi:10.1063/1.3618686.
Ohashi, Hayato, Yatsurugi, Junji, Nakamura, Nobuyuki, & Sakaue, Hiroyuki A. High resolution extreme ultraviolet spectrometer for an electron beam ion trap. United States. https://doi.org/10.1063/1.3618686
Ohashi, Hayato, Yatsurugi, Junji, Nakamura, Nobuyuki, and Sakaue, Hiroyuki A. 2011. "High resolution extreme ultraviolet spectrometer for an electron beam ion trap". United States. https://doi.org/10.1063/1.3618686.
@article{osti_22063695,
title = {High resolution extreme ultraviolet spectrometer for an electron beam ion trap},
author = {Ohashi, Hayato and Yatsurugi, Junji and Nakamura, Nobuyuki and Sakaue, Hiroyuki A},
abstractNote = {An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.},
doi = {10.1063/1.3618686},
url = {https://www.osti.gov/biblio/22063695}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 8,
volume = 82,
place = {United States},
year = {Mon Aug 15 00:00:00 EDT 2011},
month = {Mon Aug 15 00:00:00 EDT 2011}
}