Emittance estimation by an ion optical element with variable focusing strength and a viewing target
- GSI GmbH, Planckstrasse 1, D-64291 Darmstadt (Germany)
- IMP, 253 Nanchang Rd., Lanzhou 730000 (China)
The emittance of an extracted ion beam can be estimated to first order by a series of three linear independent profile measurements. This estimation is restricted to the evaluation of an upper limit of the emittance value for a homogeneous, nonfilamented beam. The beam is assumed to be round, respectively elliptical, without any structure of the intensity distribution, no space charge has been assumed for the drifting beam, and the optics is assumed to be linear. Instead of using three different drift sections, a linear focusing element with three different focusing strengths can be used. Plotting the beam radius as function of focusing strength, three independent solutions can be used to calculate the Twiss parameters {alpha}, {beta}, and {gamma} and furthermore the emittance {epsilon}. Here we describe the measurements which have been performed with the SECRAL ion source at Institute of Modern Physics Lanzhou.
- OSTI ID:
- 22053905
- Journal Information:
- Review of Scientific Instruments, Vol. 81, Issue 2; Conference: ICIS 2009: 13. international conference on ion sources, Gatlinburg, TN (United States), 20-25 Sep 2009; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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