SAMRAI: A novel variably polarized angle-resolved photoemission beamline in the VUV region at UVSOR-II

Journal Article · Sat May 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3425778· OSTI ID:22053694

Kimura, Shin-Ichi; Ito, Takahiro; Hosaka, Masahito; Katoh, Masahiro ^[1]; Sakai, Masahiro; Nakamura, Eiken; Kondo, Naonori; Horigome, Toshio; Hayashi, Kenji ^[1]; Goto, Tomohiro; Ejima, Takeo ^[2]; Soda, Kazuo ^[3]

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1. UVSOR Facility, Institute for Molecular Science, Okazaki 444-8585 (Japan)
2. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577 (Japan)
3. Graduate School of Engineering, Nagoya University, Nagoya 464-8603 (Japan)

A novel variably polarized angle-resolved photoemission spectroscopy beamline in the vacuum-ultraviolet (VUV) region has been installed at the UVSOR-II 750 MeV synchrotron light source. The beamline is equipped with a 3 m long APPLE-II type undulator with horizontally/vertically linear and right/left circular polarizations, a 10 m Wadsworth type monochromator covering a photon energy range of 6-43 eV, and a 200 mm radius hemispherical photoelectron analyzer with an electron lens of a {+-}18 deg. acceptance angle. Due to the low emittance of the UVSOR-II storage ring, the light source is regarded as an entrance slit, and the undulator light is directly led to a grating by two plane mirrors in the monochromator while maintaining a balance between high-energy resolution and high photon flux. The energy resolving power (h{nu}/{Delta}h{nu}) and photon flux of the monochromator are typically 1x10{sup 4} and 10{sup 12} photons/s, respectively, with a 100 {mu}m exit slit. The beamline is used for angle-resolved photoemission spectroscopy with an energy resolution of a few meV covering the UV-to-VUV energy range.

• OSTI ID: 22053694
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 5; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTROSTATIC LENSES
ENERGY RESOLUTION
EV RANGE
FAR ULTRAVIOLET RADIATION
LIGHT SOURCES
MEV RANGE
MIRRORS
MONOCHROMATORS
PHOTOEMISSION
PHOTONS
POLARIZATION
SPATIAL RESOLUTION
STORAGE RINGS
SYNCHROTRON RADIATION
ULTRAVIOLET RADIATION
WIGGLER MAGNETS
X-RAY PHOTOELECTRON SPECTROSCOPY