Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

Journal Article · Mon Feb 15 00:00:00 EST 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3276709· OSTI ID:22053647

Chung, Koo-Hyun; Reitsma, Mark G ^[1]

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1. Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Dr. Gaithersburg, Maryland 20899 (United States)

This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

• OSTI ID: 22053647
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 2; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ATOMIC FORCE MICROSCOPY
CALIBRATION
FRICTION
LENGTH
SENSITIVITY
TORQUE