Controlling magnetic anisotropy in epitaxial FePt(001) films

Journal Article · Wed Jul 15 00:00:00 EDT 2009 · Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films

DOI:https://doi.org/10.1116/1.3098497· OSTI ID:22053490

Zhihong, Lu; Walock, M J; LeClair, P; Butler, W H; Mankey, G J ^[1]

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1. MINT Center and Department of Physics and Astronomy, University of Alabama, Tuscaloosa, Alabama 35487-0209 (United States)

Epitaxial equiatomic Fe{sub 50}Pt{sub 50} thin films with a variable order parameter ranging from 0 to 0.9 and Fe{sub 100-x}Pt{sub x} thin films with x ranging from 33 to 50 were deposited on MgO (001) substrates by dc sputtering. A seed layer consisting of nonmagnetic Cr (4 nm)/Pt (12 nm) was used to promote the crystallinity of the magnetic films. The crystal structure and magnetic properties were gauged using x-ray diffraction and magnetometry. The magnetic anisotropy can be controlled by changing the order parameter. For Fe{sub 100-x}Pt{sub x} films, the increase in Fe composition leads to an increase in coercivity in the hard axis loop and causes a loss of perpendicular anisotropy.

• OSTI ID: 22053490
• Journal Information: Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 27, Issue 4; Other Information: (c) 2009 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANISOTROPY
COERCIVE FORCE
CRYSTAL STRUCTURE
DEPOSITION
EPITAXY
IRON ALLOYS
LAYERS
MAGNESIUM OXIDES
MAGNETIC PROPERTIES
ORDER PARAMETERS
PLATINUM ALLOYS
SPUTTERING
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION