Diagnostic development in precise opacity measurement of radiatively heated Al plasma on Shenguang II laser facility

Journal Article · Wed Apr 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3116483· OSTI ID:22053469

Yang, Zhao ^[1]; Jiamin, Yang; Jiyan, Zhang ^[2]; Jinsong, Liu; Xiao, Yuan ^[1]; Fengtao, Jin ^[2]

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1. Wuhan National Laboratory for Optoelectronics, Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074 (China)
2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900 (China)

Simultaneous measurements of the self-emission spectrum, the backlighting source spectrum, and the transmission spectrum in one shot, which reduce the experimental uncertainties from shot-to-shot fluctuation, are essential for precise opacity experiments. In order to achieve precise absorption spectrum of Al plasmas, a special half sample sandwich target was designed and short backlighter was used to provide time- and space-resolving diagnostics on the Shenguang II high power laser facility. In the measurement, a cylindrical cavity with CH foam baffles was used to provide a clean x-ray radiation environment for sample heating. The x-ray source spectrum, the transmission spectrum, and the self-emission spectrum of the soft x-ray heated Al sample were recorded in one shot with a penta-erythritol tetrakis (hydroxymethy) methane C(CH{sub 2}OH){sub 4} (PET) crystal spectrometer by using the point-projection method. Experimental results have been compared with the calculation results of a detailed level accounting opacity code.

• OSTI ID: 22053469
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 4; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ABSORPTION SPECTRA
ALUMINIUM
BAFFLES
CRYSTALS
EMISSION SPECTRA
ERYTHRITOL
LASERS
MEASURING METHODS
METHANE
OPACITY
PLASMA
PLASMA DIAGNOSTICS
PLASMA HEATING
SOFT X RADIATION
SPATIAL RESOLUTION
SPECTROMETERS
TIME RESOLUTION
X-RAY SOURCES