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Title: A portable high-field pulsed-magnet system for single-crystal x-ray scattering studies

We present a portable pulsed-magnet system for x-ray studies of materials in high magnetic fields (up to 30 T). The apparatus consists of a split-pair of minicoils cooled on a closed-cycle cryostat, which is used for x-ray diffraction studies with applied field normal to the scattering plane. A second independent closed-cycle cryostat is used for cooling the sample to near liquid helium temperatures. Pulsed magnetic fields ({approx}1 ms in total duration) are generated by discharging a configurable capacitor bank into the magnet coils. Time-resolved scattering data are collected using a combination of a fast single-photon counting detector, a multichannel scaler, and a high-resolution digital storage oscilloscope. The capabilities of this instrument are used to study a geometrically frustrated system revealing strong magnetostrictive effects in the spin-liquid state.
Authors:
;  [1] ; ; ;  [2] ; ;  [3] ;  [4]
  1. X-Ray Science Division, Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, Illinois 60439 (United States)
  2. Department of Physics and Astronomy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada)
  3. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
  4. Department of Physics, Tulane University, New Orleans, Louisiana 70118 (United States)
Publication Date:
OSTI Identifier:
22051088
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 80; Journal Issue: 11; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CAPACITORS; COOLING; CRYOSTATS; MAGNET COILS; MAGNETIC FIELDS; MAGNETOSTRICTION; MAGNETS; MONOCRYSTALS; PHOTODETECTORS; SCALERS; SPIN; TEMPERATURE RANGE 0065-0273 K; TIME RESOLUTION; X-RAY DETECTION; X-RAY DIFFRACTION