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Title: Effects of boron composition on tunneling magnetoresistance ratio and microstructure of CoFeB/MgO/CoFeB pseudo-spin-valve magnetic tunnel junctions

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3688039· OSTI ID:22038864
 [1];  [2];  [1]; ;  [3];  [3]
  1. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-0047 (Japan)
  2. National Institute for Materials Science, Tsukuba 305-0047 (Japan)
  3. Center for Spintronics Integrated Systems, Tohoku University, Sendai 980-8577 (Japan)

The effect of B concentration on the tunneling magnetoresistance (TMR) of (Co{sub 25}Fe{sub 75}){sub 100-x}B{sub x}/MgO/(Co{sub 25}Fe{sub 75}){sub 100-x}B{sub x} (x = 22 and 33) pseudo-spin-valve (P-SV) magnetic tunnel junctions (MTJs) was investigated. The TMR ratios for optimally annealed MTJs with x = 22 and 33 were 340% and 170%, respectively, at room temperature. High resolution transmission electron microscopy (HRTEM) observation showed a weaker (001) texture in the MgO barrier in the MTJ with x = 33. The bottom electrode was not fully crystallized even with a considerable amount of B in the (Co{sub 25}Fe{sub 75}){sub 67}B{sub 33}, while good epitaxy was observed between (001) textured MgO and (Co{sub 25}Fe{sub 75}){sub 78}B{sub 22} electrodes.

OSTI ID:
22038864
Journal Information:
Journal of Applied Physics, Vol. 111, Issue 4; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English